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Performance Analysis of Double Gate Junctionless Tunnel Field Effect Transistor: RF Stability Perspective

2019; Science and Information Organization; Volume: 10; Issue: 11 Linguagem: Inglês

10.14569/ijacsa.2019.0101172

2158-107X

Veerati Raju, K. Sivasankaran,

Integrated Circuits and Semiconductor Failure Analysis

This paper investigates the RF Stability performance of the Double Gate Junctionless Tunnel Field Effect Transistor (DGJL-TFET). The impact of the geometrical parameter, material and bias conditions on the key figure of merit (FoM) like Transconductance (gm), Gate capacitance (Cgg) and RF parameters like Stern Stability Factor (K), Critical Frequency (fk) are investigated. The analytical model provides the relation between fk and small signal parameters which provide guidelines for optimizing the device parameter. The results show improvement in ON current, gm, ft and fk for the optimized device structure. The optimized device parameters provide guidelines to operate DGJL-TFET for RF applications.