Talbot–Lau interferometry-based x-ray imaging system with retractable and rotatable gratings for nondestructive testing
2020; American Institute of Physics; Volume: 91; Issue: 2 Linguagem: Inglês
10.1063/1.5131306
ISSN1527-2400
AutoresNaoki Morimoto, Kosuke Kimura, Tomohiro Shirai, Takahiro Doki, S. Sano, A. Horiba, K. Kitamura,
Tópico(s)Digital Holography and Microscopy
ResumoWe develop an x-ray imaging system based on Talbot-Lau interferometry equipped with a mechanical structure for retracting and rotating gratings from the optical axis, which enables not only x-ray phase contrast imaging but also conventional x-ray imaging with high-magnification such as microcomputed tomography (μCT). We investigate the characterization of carbon fiber reinforced plastic (CFRP) laminates using this apparatus. Microcracks and fiber orientations are visualized in the dark-field images. Compared with the obtained μCT images, the relationship between the CFRP microstructures and the contrasts in the dark-field images are recognizable.
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