Proton-induced single-event effects on 28 nm Kintex-7 FPGA
2020; Elsevier BV; Volume: 107; Linguagem: Inglês
10.1016/j.microrel.2020.113594
ISSN1872-941X
AutoresZibo Wang, Wei Chen, Zhibin Yao, Fengqi Zhang, Yinhong Luo, Xiaobin Tang, Xiaoqiang Guo, Lili Ding, Cong Peng,
Tópico(s)Electrostatic Discharge in Electronics
ResumoProton experiments were performed on Kintex-7 XC7K70T field programmable gate array by using a self-developed test system at EN tandem accelerator in Peking University. The single-event upset and multiple-bit upsets induced by low-energy proton were presented, and a cross section peak under the low-energy protons was tested. Also, the experiments under high-energy protons were performed on the proton cyclotron accelerator in the China Institute of Atomic Energy, cross sections of some blocks in FPGA were obtained. Data of low-energy and high-energy experiments showed that the LET threshold of some resources were different. Results suggest that the low-energy proton-induced single event effect must be considered.
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