Prototype for dual digital traceability of metrology data using X.509 and IOTA
2020; Elsevier BV; Volume: 69; Issue: 1 Linguagem: Inglês
10.1016/j.cirp.2020.04.104
ISSN1726-0604
AutoresMartin Peterek, Benjamin Montavon,
Tópico(s)Industrial Vision Systems and Defect Detection
ResumoDistributed Sensor Services in cyber physical production systems encounter the need for traceability on a dual level: Data validity along digital processing chains must be verifiable and metrological traceability is required to ensure the measurement's physical validity. Basing on digital calibration certificate approaches in literature and standardized IoT protocols, a fully implemented approach using X.509 to represent instrument calibration and cryptographically sign measurements on record level is introduced. Signature hashes are attached to the IOTA tangle, showcasing the application of distributed ledger technologies establishing dual traceability with sensitive private measurement data. Concluding, the prototype is evaluated on a CMM dataset.
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