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Influence of Plural Scattering on the Image Quality of Thick Amorphous Objects in Transmission Electron Microscopy

1978; Cambridge University Press; Volume: 36; Issue: 3 Linguagem: Inglês

10.1017/s0424820100070011

2690-1315

H. Rose,

Machine Learning in Materials Science

The ultimate goal of electron microscopy is to elucidate the three-dimensional atomic structure of arbitrary objects. Objects are generally classified with respect to their inherent structural symmetries. The extreme cases of total order and total disorder are perfect crystals and entirely amorphous objects. In the former case the atoms are arranged in a periodic order; in the latter they are distributed at random. Neither perfect crystals nor completely amorphous solid objects exist in reality. The finite size of the atoms gives rise in every solid amorphous object to a certain shortrange order that rules out complete disorder. The amorphous carbon foils commonly used as supporting films are an example of this behavior.