Portal de Periódicos da CAPES

Building Practical Descriptors for Defect Engineering of Electrocatalytic Materials

2020; American Chemical Society; Volume: 10; Issue: 16 Linguagem: Inglês

10.1021/acscatal.0c02144

2155-5435

Raphaël Chattot, P. Bordet, Isaac Martens, Jakub Drnec, Laëtitia Dubau, Frédéric Maillard,

Semiconductor materials and devices

ADVERTISEMENT RETURN TO ISSUEPREVViewpointNEXTBuilding Practical Descriptors for Defect Engineering of Electrocatalytic MaterialsRaphaël Chattot*Raphaël ChattotUniv. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, Grenoble INP, LEPMI, 38000 Grenoble, FranceEuropean Synchrotron Radiation Facility, ID 31 Beamline, BP 220, F-38043 Grenoble, France*Email for R.C.: [email protected]More by Raphaël Chattothttp://orcid.org/0000-0001-6169-530X, Pierre BordetPierre BordetUniv. Grenoble Alpes, CNRS, Institut Néel, F-38000 Grenoble, FranceMore by Pierre Bordethttp://orcid.org/0000-0002-1488-2257, Isaac MartensIsaac MartensEuropean Synchrotron Radiation Facility, ID 31 Beamline, BP 220, F-38043 Grenoble, FranceMore by Isaac Martenshttp://orcid.org/0000-0001-8342-6629, Jakub DrnecJakub DrnecEuropean Synchrotron Radiation Facility, ID 31 Beamline, BP 220, F-38043 Grenoble, FranceMore by Jakub Drnechttp://orcid.org/0000-0002-9520-1555, Laetitia DubauLaetitia DubauUniv. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, Grenoble INP, LEPMI, 38000 Grenoble, FranceMore by Laetitia Dubauhttp://orcid.org/0000-0001-9520-1435, and Frédéric Maillard*Frédéric MaillardUniv. Grenoble Alpes, Univ. Savoie Mont Blanc, CNRS, Grenoble INP, LEPMI, 38000 Grenoble, France*Email for F.M.: [email protected]More by Frédéric Maillardhttp://orcid.org/0000-0002-6470-8900Cite this: ACS Catal. 2020, 10, 16, 9046–9056Publication Date (Web):July 13, 2020Publication History Received14 May 2020Published online13 July 2020Published inissue 21 August 2020https://pubs.acs.org/doi/10.1021/acscatal.0c02144https://doi.org/10.1021/acscatal.0c02144article-commentaryACS PublicationsCopyright © 2020 American Chemical Society. This publication is available under these Terms of Use. Request reuse permissions This publication is free to access through this site. Learn MoreArticle Views3861Altmetric-Citations33LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail PDF (8 MB) Get e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information SUBJECTS:Defects,Diseases and disorders,Nanoparticles,Physical and chemical processes,Redox reactions Get e-Alerts