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High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films

2020; Oxford University Press; Volume: 26; Issue: S2 Linguagem: Inglês

10.1017/s1431927620023387

1435-8115

Vesna Šrot, Yì Wáng, M. Minola, Ute Salzberger, M. Salluzzo, G. M. De Luca, B. Keimer, Peter van Aken,

Copper-based nanomaterials and applications

Journal Article High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films Get access Vesna Srot, Vesna Srot Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Yi Wang, Yi Wang Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Matteo Minola, Matteo Minola Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Ute Salzberger, Ute Salzberger Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Marco Salluzzo, Marco Salluzzo CNR-SPIN, Napoli, Campania, Italy Search for other works by this author on: Oxford Academic Google Scholar Gabriella Maria De Luca, Gabriella Maria De Luca Dipartimento di Fisica ``E. Pancini``, Napoli, Campania, Italy Search for other works by this author on: Oxford Academic Google Scholar Bernhard Keimer, Bernhard Keimer Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Peter van Aken Peter van Aken Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 2972–2973, https://doi.org/10.1017/S1431927620023387 Published: 01 August 2020