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FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST

2020; Institute of Electronics, Information and Communication Engineers; Volume: E103.D; Issue: 11 Linguagem: Inglês

10.1587/transinf.2019edp7235

1745-1361

Hanan T. Al-Awadhi, Tomoki Aono, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima,

Radiation Effects in Electronics

Multi-cycle Test looks promising a way to reduce the test application time of POST (Power-on Self-Test) for achieving a targeted high fault coverage specified by ISO26262 for testing automotive devices. In this paper, we first analyze the mechanism of Stuck-at Fault Detection Degradation problem in multi-cycle test. Based on the result of our analysis we propose a novel solution named FF-Control Point Insertion technique (FF-CPI) to achieve the reduction of scan-in patterns by multi-cycle test. The FF-CPI technique modifies the captured values of scan Flip-Flops (FFs) during capture operation by directly reversing the value of partial FFs or loading random vectors. The FF-CPI technique enhances the number of detectable stuck-at faults under the capture patterns. The experimental results of ISCAS89 and ITC99 benchmarks validated the effectiveness of FF-CPI technique in scan-in pattern reduction for POST.