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Effect of dopant concentration and crystalline structure on the absorption edge in ZnO:Y films

2021; Volume: 22; Issue: 1 Linguagem: Inglês

10.3116/16091833/22/1/31/2021

1816-2002

B. Turko, U. Mostovoy, Mariya Kovalenko, Yu. Eliyashevskyi, Yuriy Kulyk, O. Bovgyra, Viktor Dzikovskyi, А. Kostruba, R Vlokh, V Savaryn, V. V. Stybel, B. Tsizh, S Majevska,

Copper-based nanomaterials and applications

We study the crystalline structure and absorption spectra for the zinc oxide films with different levels of yttrium doping.The films are deposited on glass substrates, using radio-frequency magnetron sputtering.We estimate the concentration of free charge carriers and show that the 'blue' shift of the fundamental absorption edge in ZnO:Y films with increasing doping level (up to 4.7 wt.%) is explained by Burstein-Moss effect.At higher concentrations of yttrium, behaviour of the fundamental absorption edge is described by a known empirical Urbach rule.