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The 'universal' dielectric response. I

1990; Institute of Electrical and Electronics Engineers; Volume: 6; Issue: 2 Linguagem: Inglês

10.1109/57.50801

1558-4402

A.K. Jonscher,

Surface and Thin Film Phenomena

A novel approach to the interpretation of the dielectric response of solids, in terms of the concept of the universal dielectric law of relaxation, is presented. The universal approach moves away from the earlier interpretations that relied heavily on the concept of distributions of relaxation times (DRTs) of Debye-like processes that are supposed to coexist in a given material and constitute a superficially plausible model. It is argued that the DRT explanations do not stand up to critical examination. The new interpretation is based on the unique property of the empirically determined fractional power laws in frequency that the ratio of the imaginary to the real parts of the complex dielectric susceptibility is independent of frequency, in sharp contrast to the Debye law, where the ratio is proportional to frequency. The significance of the approach is illustrated by showing, in connection with the interpretation of low-frequency dispersion, that it impinges on many phenomena in physical chemistry and electrochemistry. It can also be used to advantage to study the delayed transitions of localized electrons in semiconductors and similar materials. >