Portal de Periódicos da CAPES

eFuse Design and Reliability

2008; Institute of Electrical and Electronics Engineers; Linguagem: Inglês

10.1109/irws.2008.4796111

2374-8036

W. Tonti,

Semiconductor materials and devices

Summary form only given. Programmable eFuse designs present an integration challenge in modern CMOS processing. The power level to program a fuse, and the programming methodologies leverage reliability mechanisms which all other elements in a design avoid. A high degree of eFuse process control and circuit design is required in order to guarantee operation. Almost all eFuse types are one time programmable and are limited to "one chance" programmable. This tutorial discussed selected eFuse technologies describing the design philosophy electrical programming and characterization, the physics of failure, and some of the many applications an on chip programmable element provides.