Portal de Periódicos da CAPES

The multi-optics high-resolution absorption x-ray spectrometer (HiRAXS) for studies of materials under extreme conditions

2021; American Institute of Physics; Volume: 92; Issue: 5 Linguagem: Inglês

10.1063/5.0043685

1527-2400

Stanislav Stoupin, D. B. Thorn, N. Ose, Lan Gao, K. W. Hill, Y. Ping, F. Coppari, B. Kozioziemski, A. Krygier, H. Sio, J. Ayers, M. Bitter, Brian Kraus, P. C. Efthimion, M. B. Schneider,

X-ray Diffraction in Crystallography

We report the development of a high-resolution spectrometer for extended x-ray absorption fine structure (EXAFS) studies of materials under extreme conditions. A curved crystal and detector in the spectrometer are replaceable such that a single body is employed to perform EXAFS measurements at different x-ray energy intervals of interest. Two configurations have been implemented using toroidal crystals with Ge 311 reflection set to provide EXAFS at the Cu K-edge (energy range 8.9–9.8 keV) and Ge 400 reflection set to provide EXAFS at the Ta L3-edge (9.8–10.7 keV). Key performance characteristics of the spectrometer were found to be consistent with design parameters. The data generated at the National Ignition Facility have shown an ≃3 eV spectral resolution for the Cu K-edge configuration and ≃6 eV for the Ta L3-edge configuration.