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IRIXS Spectrograph: an ultra high-resolution spectrometer for tender RIXS

2021; Wiley; Volume: 28; Issue: 4 Linguagem: Inglês

10.1107/s1600577521003805

1600-5775

J. Bertinshaw, Simon Mayer, Frank-Uwe Dill, H. Suzuki, O. Leupold, Atefeh Jafari, I. Sergueev, M. Spiwek, Ayman Said, Elina Kasman, Xianrong Huang, B. Keimer, H. Gretarsson,

X-ray Spectroscopy and Fluorescence Analysis

The IRIXS Spectrograph represents a new design of an ultra-high-resolution resonant inelastic X-ray scattering (RIXS) spectrometer that operates at the Ru L 3 -edge (2840 eV). First proposed in the field of hard X-rays by Shvyd'ko [(2015), Phys. Rev. A , 91 , 053817], the X-ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland-type spectrometer [Gretarsson et al. (2020), J. Synchrotron Rad. 27 , 538–544]. In combination with a dispersionless nested four-bounce high-resolution monochromator design that utilizes Si(111) and Al 2 O 3 (110) crystals, an overall energy resolution better than 35 meV full width at half-maximum has been achieved at the Ru L 3 -edge, in excellent agreement with ray-tracing simulations.