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First demonstration of in-beam performance of bent Monolithic Active Pixel Sensors

2022; Elsevier BV; Volume: 1028; Linguagem: Inglês

10.1016/j.nima.2021.166280

1872-9576

G. Aglieri Rinella, M. Agnello, B. Alessandro, J. Alme, F. Agnese, E. Anderssen, D. Andreou, F. Antinori, N. Apadula, P. Atkinson, R. Baccomi, Angela Badalà, A. Balbino, Christoph Bartels, R. Barthel, F. Baruffaldi, I. Belikov, S. Beolè, Philip Becht, A. Bhatti, M. Bhopal, N. Bianchi, M.B. Blidaru, G. Boca, J. Bok, G. Bonomi, M. Bonora, M. Borri, V. Borshchov, E. Botta, G. Bruno, S. Bufalino, M. Cai, P. Camerini, F. Catalano, C. Ceballos Sánchez, I. Chakaberia, M. Chartier, F. Colamaria, D. Colella, A. Collu, M. Concas, G. Contin, S. Costanza, Pengyao Cui, A. Dainese, J.B. Dainton, G. de Cataldo, C. De Martín, G. De Robertis, Wenjing Deng, B. Di Ruzza, Yu Ding, M. Durkac, D. Elia, M. R. Ersdal, M. Faggin, F. Fan, A. Fantoni, P. Fecchio, A. Feliciello, Г. Феофилов, A. Ferk, J. Ferencei, G. Fiorenza, Amanda Nicole Flores, E. Fragiacomo, D. Gajanana, A. Gal, C. Gao, Corrado Gargiulo, P. Gianotti, P. Giubilato, A. Grant, L. Greiner, A. Grelli, O.S. Groettvik, F. Grosa, C. Hu, Ryan Patrick Hannigan, Jan Anton Hasenbichler, H. Helstrup, H. Hillemanns, C. Hills, P. Hindley, B. Hippolyte, B. Hofman, Geun Hee Hong, J. F. Hu, J. P. Iddon, H. Ilyas, А. Исаков, Anna Jadlovská, S. Jadlovska, J. Jadlovsky, S. Jaelani, Thomas Johnson, A. Junique, P. Kalinak, A. Kalweit, M. Keil, Z. Khabanova, H.A. Khan, B. Kim, C. Kim, Jhoon Kim, T. Kim, Jeffrey Michael Klein, A. Kluge, C. Kobdaj, Artem Kotliarov, I. Králik, F. Křížek, T. Kugathasan, C. Kuhn, P. G. Kuijer, S. Kushpil, M. J. Kweon, Jiyeon Kwon, Y. Kwon, P. La Rocca, A. Lakrathok, Rune Langoy, P. Larionov, E. Laudi, T. Lazareva, R. Lea, R. C. Lemmon, X.L. Li, J. Lien, B. Lim, Sung-Jo Lim, S. W. Lindsay, A. Liu, J. Liu, M. Lunardon, G. Luparello, M. Lupi, M. Mager, A. Maire, Qasim Malik, G. Mandaglio, V. Manzari, Y. Mao, G. V. Margagliotti, C. Markert, P. Martinengo, S. Masciocchi, M. Masera, A. Masoni, A. Mastroserio, P. F. T. Matuoka, G. Mazza, F. Mazzaschi, M.A. Mazzoni, Frédéric Morel, V. Muccifora, A. Mulliri, L. Musa, S. V. Nesbo, D. Nesterov, J. Norman, J. Park, H. Pei, X. Peng, S. Piano, C. Pinto, S. Pisano, S. Politano, Esa Prakasa, F. Prino, M. Protsenko, M. Puccio, A. Rachevski, L. Ramello, F. Rami, I. Ravasenga, A. Rehman, F. Reidt, F. Riggi, K. Røed, D. Röhrich, F. Ronchetti, A. Rosano, M.J. Rossewij, A. Rossi, R. Rui, R. Russo, Rifki Sadikin, V. Sarritzu, J. Schambach, Serhiy Senyukov, Junghoon Seo, Ruben Shahoyan, S.F. Shaukat, S. Siddhanta, M. Sitta, R. J. M. Snellings, W. Snoeys, Arnon Songmoolnak, Jory Sonneveld, F. Soramel, M. Šuljić, Rishat Sultanov, S. Sumowidagdo, Daming Sun, X. Sun, Rafeeq Syed, Ganesh Jagannath Tambave, Siyu Tang, G. Tersimonov, M. Tkacik, M. Toppi, A. Trifirò, S. Trogolo, Victor Trubnikov, R. Turrisi, T. S. Tveter, I. Tymchuck, K. Ullaland, M. Urioni, G. L. Usaı́, N. Valle, Lennart van Doremalen, T. Vaňát, J. W. Van Hoorne, Mónika Varga-Kőfaragó, A. Velure, D. Wang, Y. Wang, J. Wikne, John R. Wright, R. Xu, Ping Yang, Z. Yin, I.-K. Yoo, Junho Yoon, S. C. Yuan, V. Zaccolo, B. Zhang, E. Zhang, X. Zhang, Vladimir Zherebchevskii, D. Zhou, Jun Zhu, Y. H. Zhu, G. Zinovjev, N. Zurlo,

Radiation Detection and Scintillator Technologies

A novel approach for designing the next generation of vertex detectors foresees to employ wafer-scale sensors that can be bent to truly cylindrical geometries after thinning them to thicknesses of 20–40 μm. To solidify this concept, the feasibility of operating bent MAPS was demonstrated using 1.5 cm×3 cm ALPIDE chips. Already with their thickness of 50 µm, they can be successfully bent to radii of about 2 cm without any signs of mechanical or electrical damage. During a subsequent characterisation using a 5.4 GeV electron beam, it was further confirmed that they preserve their full electrical functionality as well as particle detection performance.In this article, the bending procedure and the setup used for characterisation are detailed. Furthermore, the analysis of the beam test, including the measurement of the detection efficiency as a function of beam position and local inclination angle, is discussed. The results show that the sensors maintain their excellent performance after bending to radii of 2 cm, with detection efficiencies above 99.9% at typical operating conditions, paving the way towards a new class of detectors with unprecedented low material budget and ideal geometrical properties.