Portal de Periódicos da CAPES

The effect of the Doppler mismatch in microwave electrometry using Rydberg electromagnetically induced transparency and Autler–Townes splitting

2022; IOP Publishing; Volume: 55; Issue: 7 Linguagem: Inglês

10.1088/1361-6455/ac5d8d

1361-6455

Fei Zhou, Feng-Dong Jia, Jiong Mei, Xiubin Liu, Huaiyu Zhang, Yonghong Yu, Wei-Chen Liang, Jianwei Qin, Jian Zhang, Feng Xie, Zhi-Ping Zhong,

Quantum optics and atomic interactions

Abstract We have systematically investigated the influence of the gas temperature ( T ), the Rabi frequencies of the probe laser (Ω p ), the coupling laser (Ω c ) and the radio-frequency (RF) (Ω RF ) on the Rydberg electromagnetically induced transparency (EIT) and Autler–Townes (AT) splitting (Δ f ) by defining a general Doppler mismatch factor D g = Ω RF /Δ f in the Rydberg atom-based microwave electrometry. The effect of T on D g is studied in detail from 0 to 1000 K, the results show that D g is insensitive to T when T < 10 μ K or T > 10 K, while D g changes significantly with 10 K <?CDATA $ > \,T > 10\enspace \mu K$?> > T > 10 μ K . Then the effects of Ω p , Ω c and Ω RF on factor D g at T = 300 K (typical room temperature) and T = 10 μ K (typical temperature of cold atom by laser cooling) are studied in detail, respectively. The results show that the linewidth of Rydberg EIT (Γ EIT ) can be used as a key parameter to characterize the dependence of D g on Ω p and Ω c in both cases. D g is insensitive to T , Ω p and Ω c when Ω RF > 3Γ EIT which means that Γ EIT determines the lower limit of the linear region of the RF electric field strength measured by EIT–AT splitting. More interesting, the range where D g is insensitive to Ω p and Ω c can be greatly expanded by lowering the gas temperature to 10 μ K. The ranges of parameters where D g is insensitive to T , Ω p , Ω c and Ω RF are given, and such relationship can be easily scaled to other atomic systems. The results can help the selection of various parameters in the experiments and specific applications to ensure the accuracy of measuring the RF electric field.