Über die Anwendung der Interferenzpunkte an planparallelen Platten zur Analyse feinster Spektrallinien
1906; Wiley; Volume: 325; Issue: 7 Linguagem: Alemão
10.1002/andp.19063250704
ISSN1521-3889
Autores Tópico(s)Scientific Measurement and Uncertainty Evaluation
ResumoAnnalen der PhysikVolume 325, Issue 7 p. 269-292 Article Über die Anwendung der Interferenzpunkte an planparallelen Platten zur Analyse feinster Spektrallinien E. Gehrcke, E. Gehrcke Physikalisch-Technischen Reichsanstalt, CharlottenburgSearch for more papers by this authorO. von Baeyer, O. von Baeyer Physikalisch-Technischen Reichsanstalt, CharlottenburgSearch for more papers by this author E. Gehrcke, E. Gehrcke Physikalisch-Technischen Reichsanstalt, CharlottenburgSearch for more papers by this authorO. von Baeyer, O. von Baeyer Physikalisch-Technischen Reichsanstalt, CharlottenburgSearch for more papers by this author First published: 1906 https://doi.org/10.1002/andp.19063250704Citations: 17AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Citing Literature Volume325, Issue71906Pages 269-292 RelatedInformation
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