SOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITS
2004; World Scientific; Linguagem: Inglês
10.1142/9789812794703_0002
ISSN1793-1274
Autores Tópico(s)Mobile Agent-Based Network Management
ResumoSelected Topics in Electronics and SystemsRadiation Effects and Soft Errors in Integrated Circuits and Electronic Devices, pp. 15-25 (2004) No AccessSOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITSR. C. BAUMANNR. C. BAUMANNSilicon Technology Development Group, Texas Instruments Inc., 13560 North Central Expressway, MS 3737, Dallas, Texas, USAhttps://doi.org/10.1142/9789812794703_0002Cited by:2 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail Abstract: The once-ephemeral soft error has recently caused considerable concern for manufacturers of advanced silicon technology as this phenomenon now has the potential for inducing the highest failure rate of all other reliability mechanisms combined. We briefly review the three radiation mechanisms responsible for causing soft errors in commercial electronics and the basic physical mechanism by which ionizing radiation can produce a soft error. We then focus on the soft error sensitivity trends in commercial DRAM, SRAM, and peripheral logic devices as a function of technology scaling and discuss some of the solutions used for mitigating the impact of soft errors in high reliability systems. Keywords: soft error rateradiation effectssingle event upset FiguresReferencesRelatedDetailsCited By 2A Fast Technique to Reduce Power Consumption on Linear Block Codes Used to Protect RegistersRicardo Gonzalez-Toral, Pedro Reviriego, Juan Antonio Maestro and Costas Argyrides1 Jun 2018 | IEEE Transactions on Device and Materials Reliability, Vol. 18, No. 2Reducing the Power Consumption of Fault Tolerant Registers Through Hybrid ProtectionRicardo Gonzalez-Toral, Shanshan Liu, Pedro Reviriego and Juan Antonio Maestro1 Apr 2018 | IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 65, No. 4 Radiation Effects and Soft Errors in Integrated Circuits and Electronic DevicesMetrics History Keywordssoft error rateradiation effectssingle event upsetPDF download
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