Artigo
Revisado por pares
Quantitative analysis of overlapping XPS peaks by spectrum reconstruction: determination of the thickness and composition of thin iron oxide films
1998; Wiley; Volume: 26; Issue: 11 Linguagem: Inglês
10.1002/(sici)1096-9918(199810)26
ISSN1096-9918
AutoresP. C. J. Graat, Marcel A.J. Somers,
Tópico(s)Advancements in Photolithography Techniques
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