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Monitoring Bismuth Ferrite Domain Walls Behavior Under Electric Field With Atomic Resolution By In Situ Scanning Transmission Electron Microscopy

2022; Oxford University Press; Volume: 28; Issue: S1 Linguagem: Inglês

10.1017/s143192762200873x

1435-8115

Oana-Andreea Condurache, Goran Dražić, Tadej Rojac, Brahim Dkhil, Andraž Bradeško, Hana Uršič, Andreja Benc̆an,

Semiconductor materials and devices

Journal Article Monitoring Bismuth Ferrite Domain Walls Behavior Under Electric Field With Atomic Resolution By In Situ Scanning Transmission Electron Microscopy Get access Oana-Andreea Condurache, Oana-Andreea Condurache Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, SloveniaJožef Stefan International Postgraduate School, Ljubljana, Slovenia Corresponding author: oana.condurache@ijs.si Search for other works by this author on: Oxford Academic Google Scholar Goran Dražić, Goran Dražić Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, SloveniaJožef Stefan International Postgraduate School, Ljubljana, SloveniaDepartment of Materials Chemistry, National Institute of Chemistry, Ljubljana, Slovenia Search for other works by this author on: Oxford Academic Google Scholar Tadej Rojac, Tadej Rojac Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, SloveniaJožef Stefan International Postgraduate School, Ljubljana, Slovenia Search for other works by this author on: Oxford Academic Google Scholar Brahim Dkhil, Brahim Dkhil Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, Université Paris-Saclay, Paris, France Search for other works by this author on: Oxford Academic Google Scholar Andraž Bradeško, Andraž Bradeško Laboratoire Structures, Propriétés et Modélisation des Solides, CentraleSupélec, Université Paris-Saclay, Paris, France Search for other works by this author on: Oxford Academic Google Scholar Hana Uršič, Hana Uršič Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, SloveniaJožef Stefan International Postgraduate School, Ljubljana, Slovenia Search for other works by this author on: Oxford Academic Google Scholar Andreja Benčan Andreja Benčan Electronic Ceramics Department, Jožef Stefan Institute, Ljubljana, SloveniaJožef Stefan International Postgraduate School, Ljubljana, Slovenia Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2272–2274, https://doi.org/10.1017/S143192762200873X Published: 01 August 2022