Advanced FIB/SEM Sample Preparation and Analysis Techniques
2023; Volume: 84758; Linguagem: Inglês
10.31399/asm.cp.istfa2023tpm1
ISSN0890-1740
AutoresSam Subramanian, Khiem Ly, Charles Petri, Tony Chrastecky, Jacob Levenson, Rohin Agny, Stefano Larentis,
Tópico(s)Advanced Electron Microscopy Techniques and Applications
ResumoAbstract Presentation slides for the ISTFA 2023 Tutorial session “Advanced FIB/SEM Sample Preparation and Analysis Techniques.”
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