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Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update)

2024; Volume: 84925; Linguagem: Inglês

10.31399/asm.cp.istfa2024tpo1

ISSN

0890-1740

Autores

Sam Subramanian, Eric Yi, Khiem Ly, Charles Petri, Tony Chrastecky, Jacob Levenson, Rohin Agny,

Tópico(s)

Advanced Electron Microscopy Techniques and Applications

Resumo

Abstract Presentation slides for the ISTFA 2024 Tutorial session “Advanced FIB/SEM Sample Preparation and Analysis Techniques (2024 Update).”

Referência(s)